Spectroscopic Ellipsometry

Optical response of nanostructured GaSb

Materials Engineering / Condensed Matter Physics / Quantum Physics / Oscillations / Spectroscopic Ellipsometry / Mueller Matrix Polarimetry

High-speed, high-accuracy optical measurements of polycrystalline silicon for process control

Engineering / Technology / Scattering Theory / Physical sciences / Feedback Control / Spectroscopic Ellipsometry / Thin Solid Films / Reactive ion etching / Polycrystalline Silicon / Film Thickness / Spectroscopic Ellipsometry / Thin Solid Films / Reactive ion etching / Polycrystalline Silicon / Film Thickness

A structural study of organo-silicon polymeric thin films deposited by remote microwave plasma enhanced chemical vapour deposition

Materials Engineering / Condensed Matter Physics / Ultraviolet / Thin Film / Plasma Enhanced Chemical vapour deposition (PECVD) / Refractive Index / Optical Properties / Surface and Coatings Technology / Fourier transform infrared spectroscopy / Spectroscopic Ellipsometry / Thin film deposition / X Ray Photoelectron Spectroscopy / Refractive Index / Optical Properties / Surface and Coatings Technology / Fourier transform infrared spectroscopy / Spectroscopic Ellipsometry / Thin film deposition / X Ray Photoelectron Spectroscopy

Copyright © 2017 DADOSPDF Inc.